Material structure analysis

Material structure analysis
X-ray diffractometer is the most common technique for determining the phase composition of an unknown sample. X-ray diffraction is used to identify the phase structure, distinguishing the main phase, minor phase, and trace phase compound and element content in the sample. The analysis results also include information such as phase name, chemical formula, crystal system, and crystal cell size of the unit cell. Using the crystal structure database ICSD and the material structure database ICDD as the basis for sample structure analysis, the Rietveld analysis method can be used to obtain the most reliable quantitative analysis results and phase structure.



DX-27mini Benchtop X-ray Diffractometer

DX-2700BH X-ray Diffractometer