Grain size determination

Grain size determination
Due to the small size of the nanomaterials, it is easy to form agglomerates, and the usual particle size analyzer often gives wrong data. The average particle size of the nanoparticles can be accurately determined by the X-ray diffraction line width method (Xie Le method).

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DX-2700BH X-ray Diffractometer

DX-2800 High Resolution X-ray Diffractometer